Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study.
Wenhan FuChen Fu ChienLizhen TangPublished in: J. Intell. Manuf. (2022)
Keyphrases
- fault diagnosis
- integrated circuit
- expert systems
- bayesian networks
- printed circuit boards
- fault detection
- neural network
- power transformers
- fuzzy logic
- fault detection and diagnosis
- rotating machinery
- operating conditions
- chemical process
- case study
- monitoring and fault diagnosis
- electronic equipment
- condition monitoring
- bp neural network
- fault identification
- gas turbine
- multiple faults
- industrial systems
- analog circuits
- power plant
- artificial intelligence
- real time
- hardware description language
- failure diagnosis
- control system
- knowledge base
- fault detection and isolation
- low cost
- machine learning
- smart card