Fault Pattern Oriented Defect Diagnosis for Memories.
Chih-Wea WangKuo-Liang ChengJih-Nung LeeYung-Fa ChouChih-Tsun HuangCheng-Wen WuFrank HuangHong-Tzer YangPublished in: ITC (2003)
Keyphrases
- fault diagnosis
- fault detection
- multiple faults
- associative memory
- fault model
- pattern matching
- fault isolation
- fault management
- fault models
- expert systems
- fault detection and isolation
- incipient fault
- automatic diagnosis
- pattern detection
- fault detection and diagnosis
- normal operation
- neural network
- gas turbine
- diagnostic tests
- genetic algorithm
- database
- failure modes
- pattern discovery
- fuzzy logic
- multi sensor information fusion