SCAN LINE
Experts
- Shin'ichiro Okazaki
- Nobuyuki Yamashita
- Yoshihiro Fujita
- Stanislav G. Sedukhin
- Ismail Ababneh
- Dan I. Moldovan
- Saad Bani-Mohammad
- Peter Willett
- Yasushi Sumi
- Fumiaki Tomita
- Chang-Sung Jeong
- Narayanan Vijaykrishnan
- Yoshihiro Kawai
- Sun-Yuan Kung
- Myung Hoon Sunwoo
- Nelson Morgan
- Viktor K. Prasanna
- Yoshi Sugiyama
- Ahmed Sherif Zekri
- Mladen Berekovic
- Stephen James
- James Beck
- Manfred Kunde
- Joachim Beer
- Junxian He
- Roberto Guerrieri
- Hun-Seok Kim
- Rafael Domínguez-Castro
- Phil Kohn
- Oscar H. Ibarra
- Eric Allman
- Edie M. Rasmussen
- Hussein M. Alnuweiri
- Konstantinos G. Margaritis
- Danny Krizanc
- Hongchi Shi
- Alan L. Yuille
- Toshio Kondo
- Panagiotis D. Michailidis
Venues
- CoRR
- ICASSP
- ASAP
- IEEE Trans. Computers
- CVPR
- J. Parallel Distributed Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- ISCAS
- ISCA
- Parallel Comput.
- ICRA
- Sensors
- IEEE J. Solid State Circuits
- ICPP (3)
- Inf. Process. Lett.
- IJCNN
- SIGGRAPH
- IEEE Trans. Circuits Syst. Video Technol.
- Systems and Computers in Japan
- IJCAI
- ICIP
- CVPR Workshops
- CONPAR
- Remote. Sens.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- J. VLSI Signal Process.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Computer Graphics and Applications
- Pattern Recognit.
- ICCD
- ICPP
- ICPR
- Microprocess. Microprogramming
- CIT
- Eurographics
- Pattern Recognit. Lett.
- Image Vis. Comput.
- Computer
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