SCAN LINE
Experts
- Shin'ichiro Okazaki
- Yoshihiro Fujita
- Stanislav G. Sedukhin
- Nobuyuki Yamashita
- Ismail Ababneh
- Peter Willett
- Dan I. Moldovan
- Saad Bani-Mohammad
- Yasushi Sumi
- Fumiaki Tomita
- Myung Hoon Sunwoo
- Stephen James
- Chang-Sung Jeong
- Sun-Yuan Kung
- Nelson Morgan
- Ahmed Sherif Zekri
- Manfred Kunde
- Yoshi Sugiyama
- Mladen Berekovic
- Yoshihiro Kawai
- James Beck
- Viktor K. Prasanna
- Narayanan Vijaykrishnan
- Tom Vander Aa
- N. Ranganathan
- Xiaoyan Xie
- Phil Kohn
- Isaac D. Scherson
- N. Bhavanishankar
- Hun-Seok Kim
- Itsuo Takanami
- Alberto Ferrari
- Mohamed Ould-Khaoua
- Rafael Domínguez-Castro
- Junxian He
- Takashi Yoshimi
- Oscar H. Ibarra
- Danny Krizanc
- Eric Allman
Venues
- CoRR
- ICASSP
- J. Parallel Distributed Comput.
- ASAP
- CVPR
- IEEE Trans. Computers
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- ISCAS
- ISCA
- IEEE J. Solid State Circuits
- Parallel Comput.
- IJCNN
- Inf. Process. Lett.
- Sensors
- SIGGRAPH
- ICPP (3)
- ICIP
- IJCAI
- CVPR Workshops
- Systems and Computers in Japan
- IEEE Trans. Circuits Syst. Video Technol.
- CONPAR
- Pattern Recognit.
- ICPP
- IEEE Computer Graphics and Applications
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICRA
- Remote. Sens.
- ICCD
- J. VLSI Signal Process.
- Neurocomputing
- MVA
- ICPR
- IROS
- CIT
- Comput. Graph. Forum
- Eur. J. Oper. Res.
- Image Vis. Comput.
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