SCAN LINE
Experts
- Shin'ichiro Okazaki
- Stanislav G. Sedukhin
- Nobuyuki Yamashita
- Yoshihiro Fujita
- Ismail Ababneh
- Yasushi Sumi
- Fumiaki Tomita
- Peter Willett
- Saad Bani-Mohammad
- Dan I. Moldovan
- Mladen Berekovic
- James Beck
- Viktor K. Prasanna
- Narayanan Vijaykrishnan
- Yoshi Sugiyama
- Chang-Sung Jeong
- Manfred Kunde
- Myung Hoon Sunwoo
- Nelson Morgan
- Yoshihiro Kawai
- Sun-Yuan Kung
- Stephen James
- Ahmed Sherif Zekri
- Leonard T. Bruton
- Jie Tian
- Rafael DomÃnguez-Castro
- Arjuna Madanayake
- Hun-Seok Kim
- Edie M. Rasmussen
- Simon Hermann
- Phil Kohn
- Danny Krizanc
- Konstantinos G. Margaritis
- Toshio Kondo
- Itsuo Takanami
- Rongrong Ji
- N. Bhavanishankar
- Isaac D. Scherson
- Takashi Yoshimi
Venues
- CoRR
- ICASSP
- ASAP
- IEEE Trans. Computers
- J. Parallel Distributed Comput.
- CVPR
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCA
- ISCAS
- ICRA
- IEEE J. Solid State Circuits
- Parallel Comput.
- Sensors
- Inf. Process. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- ICPP (3)
- SIGGRAPH
- IJCNN
- ICIP
- CONPAR
- CVPR Workshops
- IJCAI
- Systems and Computers in Japan
- Remote. Sens.
- Pattern Recognit.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Computer Graphics and Applications
- ICCD
- ICPP
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- J. VLSI Signal Process.
- Pattern Recognit. Lett.
- Computer
- MVA
- Eurographics
- Comput. Graph. Forum
- SIGIR
- Image Vis. Comput.
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