PINHOLE CAMERA
Experts
- Xianghua Ying
- Hongbin Zha
- Guoyu Lu
- Zhanyi Hu
- Peter F. Sturm
- San Jiang
- Yasunori Ishii
- Javier Civera
- Adrien Bartoli
- Wanshou Jiang
- Khalid Satori
- Stergios I. Roumeliotis
- Jan-Michael Frahm
- Chandra Kambhamettu
- Satoshi Sato
- Jen-Hui Chuang
- Takayoshi Yamashita
- David Jelinek
- Jakub Rozlivek
- Camillo J. Taylor
- Stefan Langerman
- Jun Sato
- Kyung Ho Jang
- Xiao Liu
- Cheng Sun
- Xuchong Qiu
- Eduardo M. Nebot
- Sébastien Collette
- Soon Ki Jung
- Nabil El Akkad
- Qingquan Li
- Jae-Hean Kim
- Drew Steedly
- Jose Franco
- Kostas Daniilidis
- Alexander Wendel
- Vincent Ly
- Paul F. Whelan
- Vida Dujmovic
Venues
- CoRR
- ICRA
- CVPR
- ICCV
- IEEE Access
- IEEE Trans. Instrum. Meas.
- IROS
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- ICPR (1)
- ICIP
- ICPR
- CVPR Workshops
- Remote. Sens.
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Comput. Vis.
- BMVC
- Pattern Recognit.
- IEEE Trans. Circuits Syst. Video Technol.
- EUSIPCO
- VISAPP (1)
- ICASSP
- ROBIO
- CRV
- SII
- ITSC
- Comput. Vis. Image Underst.
- 3DIM
- CDC
- Pattern Recognit. Lett.
- DAGM-Symposium
- ECCV (2)
- IEEE Trans. Robotics
- J. Math. Imaging Vis.
- RCAR
- IET Image Process.
- Artif. Life Robotics
- ECCV (3)
- Image Vis. Comput.
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