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Experts
- Masatoshi Ishikawa
- Sukhan Lee
- Yoshihiro Watanabe
- Hiromasa Oku
- Hiraku Okada
- Srinivasa G. Narasimhan
- Takaya Yamazato
- Toshiaki Fujii
- Tomohiro Yendo
- Thomas P. Koninckx
- Christophe Doignon
- Muhammad Atif
- Daisuke Iwai
- Luc Van Gool
- Pierre Graebling
- Zhan Song
- Fumihito Arai
- Idaku Ishii
- Frank Forster
- Shintaro Arai
- Shingo Kagami
- Diana Borza
- Razvan Itu
- Kosuke Sato
- Qingchang Tan
- Shree K. Nayar
- Qi Hao
- Takefumi Hiraki
- Tomohiro Sueishi
- Joaquim Salvi
- Yuji Yamakawa
- Siyuan Liu
- Radu Danescu
- Didier Stricker
- Akira Hirabayashi
- Xavier Maurice
- Yushi Guan
- Sang Wook Lee
- Saumitra Pal
Venues
- Sensors
- CoRR
- IROS
- ICRA
- IEEE Trans. Instrum. Meas.
- IEEE Access
- ISCAS
- IEEE Trans. Ind. Electron.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- IECON
- OFC
- CVPR Workshops
- ICCV
- ROBIO
- ICECS
- Pattern Recognit.
- ITSC
- IEICE Trans. Electron.
- ICASSP
- Comput. Electron. Agric.
- CHI Extended Abstracts
- VR
- ITC
- IEEE Robotics Autom. Lett.
- Three-Dimensional Image Capture and Applications
- CICC
- ICIRA (2)
- BioCAS
- J. Real Time Image Process.
- Int. J. Autom. Technol.
- J. Robotics Mechatronics
- AIM
- IACR Cryptol. ePrint Arch.
- Real-Time Image and Video Processing
- ICCE
- IEEE Trans. Image Process.
- WACV
- ICIP (3)
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