FEATURE TRACKING
Experts
- Stefano Soatto
- Marc Pollefeys
- Luc Van Gool
- Davide Scaramuzza
- Daniel Cremers
- Claude Jauffret
- Guillermo Gallego
- Yiannis Aloimonos
- Michael J. Black
- K. Madhava Krishna
- Shuhan Shen
- Takeo Kanade
- Alessio Del Bue
- Denis Pillon
- Tomás Pajdla
- John Oliensis
- Richard Szeliski
- Hainan Cui
- Q. M. Jonathan Wu
- Andrew J. Davison
- J. M. M. Montiel
- Shuaicheng Liu
- Jan-Michael Frahm
- David Suter
- Horst Bischof
- Zhanyi Hu
- Didier Stricker
- Hujun Bao
- Yasuaki Ito
- Long Quan
- John S. Zelek
- Cornelia Fermüller
- Chandra Kambhamettu
- Yasuyuki Sugaya
- Dmitry B. Goldgof
- Yoshiaki Shirai
- Masayuki Fujita
- Patrick Bouthemy
- Koji Nakano
Venues
- CoRR
- CVPR
- ICRA
- Sensors
- IROS
- ICCV
- ICIP
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- BMVC
- IEEE Access
- Int. J. Comput. Vis.
- ICASSP
- ROBIO
- Image Vis. Comput.
- ACC
- Comput. Vis. Image Underst.
- FUSION
- WACV
- IEEE Robotics Autom. Lett.
- EMBC
- IEEE Trans. Instrum. Meas.
- CVPR Workshops
- Pattern Recognit.
- IGARSS
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- IEEE Trans. Circuits Syst. Video Technol.
- MVA
- 3DV
- CRV
- ICCV Workshops
- NeuroImage
- Mach. Vis. Appl.
- SMC
- ECCV (2)
- IEICE Trans. Inf. Syst.
- ECCV (1)
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