CUTTING TOOL
Experts
- Kunpeng Zhu
- Kai Tang
- Berend Denkena
- Han Ding
- Geok Soon Hong
- Luis Norberto López de Lacalle
- Marek Balazinski
- Safian Sharif
- Keiichi Shirase
- Pan Fu
- Michael Barton
- Yoke San Wong
- Chih-Hsing Chu
- Erel Segal-Halevi
- Helmut Pottmann
- Yuan-Shin Lee
- Qun Ren
- Anthony D. Hope
- Azlan Mohd Zain
- Naohiko Sugita
- Habibollah Haron
- Fritz Klocke
- Hongli Gao
- Hsi-Yung Feng
- Junhong Zhou
- Rodolfo E. Haber
- Xiaoming Zhang
- Takashi Matsumura
- Ming Luo
- Mamoru Mitsuishi
- Luc Baron
- Surjya K. Pal
- Andrés Bustillo
- Steven Y. Liang
- Rubén Morales-Menéndez
- Krzysztof Jemielniak
- Kejia Zhuang
- Fumihiro Itoigawa
- Chee Khiang Pang
Venues
- Int. J. Autom. Technol.
- Comput. Aided Des.
- Sensors
- J. Intell. Manuf.
- CoRR
- Prod. Eng.
- Int. J. Comput. Integr. Manuf.
- Int. J. Manuf. Res.
- DAC
- IEEE Access
- Int. J. Manuf. Technol. Manag.
- IEEE Trans. Instrum. Meas.
- ICCAD
- Expert Syst. Appl.
- Robotics Comput. Integr. Manuf.
- Simul. Model. Pract. Theory
- IEEE Trans. Ind. Electron.
- CASE
- ICIRA (2)
- ICRA
- Appl. Soft Comput.
- Comput. Ind. Eng.
- Adv. Eng. Softw.
- Int. J. Comput. Appl. Technol.
- AIM
- J. Comput. Des. Eng.
- Comput. Aided Geom. Des.
- Neural Comput. Appl.
- Comput. Ind.
- IEEE Trans. Ind. Informatics
- Int. J. Prod. Res.
- IFIP Congress
- Eng. Appl. Artif. Intell.
- Int. J. Comput. Aided Eng. Technol.
- J. Comput. Inf. Sci. Eng.
- CADUI
- ETFA
- IJCAI
- ICDMA
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