AFFECT DETECTION
Experts
- Sidney K. D'Mello
- Li Zhang
- Björn W. Schuller
- John A. Barnden
- Li Zhang
- Mitsuru Ishizuka
- Ryan S. Baker
- James C. Lester
- Rafael A. Calvo
- Helmut Prendinger
- Alan M. Wallington
- Georgios N. Yannakakis
- Elisabeth André
- Erik Cambria
- Jonathan P. Rowe
- Kenneth O. Stanley
- Antonios Liapis
- Arthur C. Graesser
- Satoshi Nakamura
- Nigel Bosch
- Nathan L. Henderson
- Robert J. Hendley
- Jaclyn Ocumpaugh
- Gautam Biswas
- Luc Paquette
- Seunghyun Yoon
- Christine L. Lisetti
- Trisha Mittal
- Sujith M. Gowda
- Aniket Bera
- Winslow Burleson
- Uttaran Bhattacharya
- Kyomin Jung
- Alena Neviarouskaya
- M. Alamgir Hossain
- Rohan Chandra
- Dinesh Manocha
- Theodoros Kostoulas
- Asif Ekbal
Venues
- CoRR
- IUI
- ACII
- ICMI
- IUI Companion
- AIED
- INTERSPEECH
- Sensors
- IEEE Trans. Affect. Comput.
- EDM
- Artif. Life
- CHI
- LREC
- NeuroImage
- CogSci
- AAAI
- IEEE Access
- RO-MAN
- CHI Extended Abstracts
- EMBC
- IVA
- Cyberpsychology Behav. Soc. Netw.
- Knowl. Based Syst.
- Advances in Computer Entertainment Technology
- ACM Multimedia
- Proc. ACM Hum. Comput. Interact.
- FIE
- AI Mag.
- Comput. Hum. Behav.
- Int. J. Soc. Robotics
- SMC
- Multimodal Technol. Interact.
- IEEE Pervasive Comput.
- IUI Workshops
- MuSe @ ACM Multimedia
- ITS
- FLAIRS Conference
- ICASSP
- IWSDS
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