AFFECT DETECTION
Experts
- Sidney K. D'Mello
- Li Zhang
- Björn W. Schuller
- Li Zhang
- John A. Barnden
- James C. Lester
- Ryan S. Baker
- Mitsuru Ishizuka
- Rafael A. Calvo
- Helmut Prendinger
- Alan M. Wallington
- Georgios N. Yannakakis
- Elisabeth André
- Erik Cambria
- Antonios Liapis
- Nigel Bosch
- Nathan L. Henderson
- Kenneth O. Stanley
- Arthur C. Graesser
- Jaclyn Ocumpaugh
- Satoshi Nakamura
- Jonathan P. Rowe
- Gautam Biswas
- Robert J. Hendley
- Christine L. Lisetti
- Asif Ekbal
- Sujith M. Gowda
- Kyomin Jung
- Rohan Chandra
- Dinesh Manocha
- Winslow Burleson
- M. Alamgir Hossain
- Theodoros Kostoulas
- Trisha Mittal
- Luc Paquette
- Alena Neviarouskaya
- Uttaran Bhattacharya
- Seunghyun Yoon
- Aniket Bera
Venues
- CoRR
- IUI
- ICMI
- ACII
- IUI Companion
- AIED
- INTERSPEECH
- IEEE Trans. Affect. Comput.
- Sensors
- EDM
- Artif. Life
- CogSci
- CHI
- AAAI
- LREC
- NeuroImage
- CHI Extended Abstracts
- RO-MAN
- EMBC
- IVA
- IEEE Access
- Comput. Hum. Behav.
- Knowl. Based Syst.
- AI Mag.
- Advances in Computer Entertainment Technology
- FIE
- Cyberpsychology Behav. Soc. Netw.
- ACM Multimedia
- Proc. ACM Hum. Comput. Interact.
- SMC
- Multim. Tools Appl.
- IEEE Pervasive Comput.
- Int. J. Soc. Robotics
- FLAIRS Conference
- ACL
- Edutainment
- MuSe @ ACM Multimedia
- Multimodal Technol. Interact.
- AIED (1)
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