AFFECT DETECTION
Experts
- Sidney K. D'Mello
- Li Zhang
- Björn W. Schuller
- Li Zhang
- John A. Barnden
- Ryan S. Baker
- Mitsuru Ishizuka
- James C. Lester
- Rafael A. Calvo
- Georgios N. Yannakakis
- Erik Cambria
- Helmut Prendinger
- Alan M. Wallington
- Elisabeth André
- Arthur C. Graesser
- Robert J. Hendley
- Antonios Liapis
- Nigel Bosch
- Jonathan P. Rowe
- Nathan L. Henderson
- Gautam Biswas
- Kenneth O. Stanley
- Satoshi Nakamura
- Jaclyn Ocumpaugh
- Rohan Chandra
- Luc Paquette
- Uttaran Bhattacharya
- Winslow Burleson
- Christine L. Lisetti
- Seunghyun Yoon
- Kyomin Jung
- Asif Ekbal
- Alena Neviarouskaya
- Theodoros Kostoulas
- Takashi Ikegami
- Trisha Mittal
- M. Alamgir Hossain
- Aniket Bera
- Dinesh Manocha
Venues
- CoRR
- IUI
- ICMI
- ACII
- IUI Companion
- AIED
- Sensors
- INTERSPEECH
- IEEE Trans. Affect. Comput.
- Artif. Life
- EDM
- LREC
- CHI
- NeuroImage
- IEEE Access
- RO-MAN
- IVA
- AAAI
- EMBC
- CogSci
- ACM Multimedia
- CHI Extended Abstracts
- FIE
- Advances in Computer Entertainment Technology
- Knowl. Based Syst.
- Proc. ACM Hum. Comput. Interact.
- AI Mag.
- Comput. Hum. Behav.
- AIED (1)
- ACL
- ITS
- MuSe @ ACM Multimedia
- SMC
- Multimodal Technol. Interact.
- FLAIRS Conference
- ICASSP
- IEEE Pervasive Comput.
- IWSDS
- Edutainment
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