Zhiqiang You

Publication Activity (10 Years)

Years Active: 2004-2023
Publications (10 Years): 12

Top Topics

Reconstructed Image

Contrastive Divergence

Compression Ratio

Decomposition Method

Top Venues

IEICE Electron. Express

Eur. J. Control

Publications

Jing Yang, Zhiqiang You, Zhiwei Zhong, Peng Liu, Langqi Mei, Shenguang Huang
DTTR: Detecting Text with Transformers. ICASSP (2023)
Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, Krishnendu Chakrabarty
Fault Modeling and Efficient Testing of Memristor-Based Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (11) (2021)
Lian Yao, Peng Liu, Jigang Wu, Yinhe Han, Yuehang Zhong, Zhiqiang You
Integrating Two Logics Into One Crossbar Array for Logic Gate Design. IEEE Trans. Circuits Syst. II Express Briefs 68 (8) (2021)
Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han
Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Pavlo Melnyk, Zhiqiang You, Keqin Li
A high-performance CNN method for offline handwritten Chinese character recognition and visualization. Soft Comput. 24 (11) (2020)
Minghe Zhang, Jishun Kuang, Jing Huang, Zhiqiang You
A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data. HPCC/SmartCity/DSS (2019)
Wei Liang, Jing Long, Xia Lei, Zhiqiang You, Haibo Luo, Jiahong Cai, Kuan-Ching Li
Efficient data packet transmission algorithm for IPV6 mobile vehicle network based on fast switching model with time difference. Future Gener. Comput. Syst. 100 (2019)
Peng Liu, Jigang Wu, Zhiqiang You, Michael Elimu, Weizheng Wang, Shuo Cai
Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory. ATS (2018)
Liubao Deng, Zhiqiang You, Yuefen Chen
Optimistic value model of multidimensional uncertain optimal control with jump. Eur. J. Control 39 (2018)
Yan Chen, Zhiqiang You, Yingjie Zhang, Jishun Kuang, Jing Zhang
A novel memristor-based restricted Boltzmann machine for contrastive divergence. IEICE Electron. Express 15 (2) (2018)
Pavlo Melnyk, Zhiqiang You, Keqin Li
A High-Performance CNN Method for Offline Handwritten Chinese Character Recognition and Visualization. CoRR (2018)
Liao Wu, Jishun Kuang, Zhiqiang You, Peng Liu, Shuo Cai
A parallel-SSHI rectifier for ultra-low-voltage piezoelectric vibration energy harvesting. IEICE Electron. Express 13 (17) (2016)
Bosheng Liu, Ying Wang, Zhiqiang You, Yinhe Han, Xiaowei Li
A signal degradation reduction method for memristor ratioed logic (MRL) gates. IEICE Electron. Express 12 (8) (2015)
Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Weizheng Wang
Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm. IEICE Electron. Express 12 (23) (2015)
Tieqiao Liu, Jishun Kuang, Shuo Cai, Zhiqiang You
An efficient small-delay faults simulator based on critical path tracing. Int. J. Circuit Theory Appl. 43 (8) (2015)
Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou
Improve the compression ratios for code-based test vector compressions by decomposing. ETS (2015)
Weiwei Wang, Zhiqiang You, Peng Liu, Jishun Kuang
An adaptive neural network A/D converter based on CMOS/memristor hybrid design. IEICE Electron. Express 11 (24) (2014)
Zhiqiang You, Xiao-Pu Han, Linyuan Lü, Chi Ho Yeung
Empirical studies on the network of social groups: the case of Tencent QQ. CoRR (2014)
Aobo Pan, Yaping Lin, Wenjie Che, Zhiqiang You, Yonghe Liu, Jinguo Li
A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design. IEICE Electron. Express 10 (19) (2013)
Bosheng Liu, Zhiqiang You, Xiangrao Li, Jishun Kuang, Zheng Qin
Comparator and half adder design using complementary resistive switches crossbar. IEICE Electron. Express 10 (13) (2013)
Huaiyu Xu, Jihui Xu, Zhiqiang You, Wenqi Peng, Kunlin Zhang, Jinfeng Xu
Thermal Simulation of Traction System for High-Speed Train Based on Heat Accumulation. J. Comput. 7 (4) (2012)
Ling Zhang, Jishun Kuang, Zhiqiang You
Virtual scan chains reordering using a RAM-based module for high test compression. Microelectron. J. 43 (11) (2012)
Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin
A scan disabling-based BAST scheme for test cost and test power reduction. IEICE Electron. Express 9 (2) (2012)
Weizheng Wang, Jishun Kuang, Zhiqiang You
Achieving low capture and shift power in linear decompressor-based test compression environment. Microelectron. J. 43 (2) (2012)
Weizheng Wang, Jishun Kuang, Peng Liu, Xin Peng, Zhiqiang You
Switching activity reduction for scan-based BIST using weighted scan input data. IEICE Electron. Express 9 (10) (2012)
Zhiqiang You, Weizheng Wang, Zhiping Dou, Peng Liu, Jishun Kuang
A scan disabling-based BAST scheme for test cost reduction. IEICE Electron. Express 8 (16) (2011)
Ling Zhang, Jishun Kuang, Zhiqiang You
Test data compression using interval broadcast scan for embedded cores. Microelectron. J. 42 (11) (2011)
Ling Zhang, Jishun Kuang, Zhiqiang You
Test Data Compression Using Selective Sparse Storage. J. Electron. Test. 27 (4) (2011)
Dayu Shi, Huaiyu Xu, Ruidan Su, Zhiqiang You
A GEO-Related IOT Applications Platform Based on Google Map. ICEBE (2010)
Ling Zhang, Jishun Kuang, Zhiqiang You
Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core. ICA3PP (2) (2010)
Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara
Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. Asian Test Symposium (2010)
Gui Dai, Zhiqiang You, Jishun Kuang, Jiedi Huang
DCScan: A Power-Aware Scan Testing Architecture. ATS (2008)
Jishun Kuang, Ouyang Xiong, Zhiqiang You
A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself. ATS (2008)
Yong-sheng Cheng, Zhiqiang You, Jishun Kuang
Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction. DELTA (2008)
Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara
A Low Power Deterministic Test Using Scan Chain Disable Technique. IEICE Trans. Inf. Syst. (6) (2006)
Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara
Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths. IEICE Trans. Inf. Syst. (8) (2005)
Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara
Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths. Asian Test Symposium (2004)