Peng Liu

Publication Activity (10 Years)

Years Active: 2011-2024
Publications (10 Years): 21

Top Topics

Affine Invariance

Convolutional Neural Networks

Top Venues

IEICE Electron. Express

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Inf. Forensics Secur.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Yi Chen, Bosheng Liu, Yongqi Xu, Jigang Wu, Xiaoming Chen, Peng Liu, Qingguo Zhou, Yinhe Han
Accelerating Frequency-domain Convolutional Neural Networks Inference using FPGAs. ISCAS (2024)
Qingxiao Guan, Peng Liu, Weiming Zhang, Wei Lu, Xinpeng Zhang
Double-Layered Dual-Syndrome Trellis Codes Utilizing Channel Knowledge for Robust Steganography. IEEE Trans. Inf. Forensics Secur. 18 (2023)
Bosheng Liu, Zhuoshen Jiang, Yalan Wu, Jigang Wu, Xiaoming Chen, Peng Liu, Qingguo Zhou, Yinhe Han
Frequency-Domain Inference Acceleration for Convolutional Neural Networks Using ReRAMs. IEEE Trans. Parallel Distributed Syst. 34 (12) (2023)
Yalan Wu, Jigang Wu, Peng Liu, Yinhe Han, Thambipillai Srikanthan
Reconfiguration algorithms for synchronous communication on switch based degradable arrays. Parallel Comput. 111 (2022)
Zhen Wang, Guofa Zhang, Peng Liu, Jing Ye, Jianhui Jiang
Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit. IEEE Trans. Very Large Scale Integr. Syst. 30 (10) (2022)
Bosheng Liu, Xiaoming Chen, Yinhe Han, Jigang Wu, Liang Chang, Peng Liu, Haobo Xu
Search-Free Inference Acceleration for Sparse Convolutional Neural Networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Weizheng Wang, Xiangqi Wang, Jin Wang, Neal N. Xiong, Shuo Cai, Peng Liu
Ensuring Cryptography Chips Security by Preventing Scan-Based Side-Channel Attacks With Improved DFT Architecture. IEEE Trans. Syst. Man Cybern. Syst. 52 (3) (2022)
Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, Krishnendu Chakrabarty
Fault Modeling and Efficient Testing of Memristor-Based Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (11) (2021)
Lian Yao, Peng Liu, Jigang Wu, Yinhe Han, Yuehang Zhong, Zhiqiang You
Integrating Two Logics Into One Crossbar Array for Logic Gate Design. IEEE Trans. Circuits Syst. II Express Briefs 68 (8) (2021)
Bosheng Liu, Zhuoshen Jiang, Jigang Wu, Xiaoming Chen, Yinhe Han, Peng Liu
F3D: Accelerating 3D Convolutional Neural Networks in Frequency Space Using ReRAM. DAC (2021)
Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han
Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electron. Test. 36 (4) (2020)
Weizheng Wang, Jincheng Wang, Wei Wang, Peng Liu, Shuo Cai
A Secure DFT Architecture Protecting Crypto Chips Against Scan-Based Attacks. IEEE Access 7 (2019)
Peng Liu, Jigang Wu, Zhiqiang You, Michael Elimu, Weizheng Wang, Shuo Cai
Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory. ATS (2018)
Tieqiao Liu, Peng Liu, Yi Liu
An efficient controlled LFSR hybrid BIST scheme. IEICE Electron. Express 15 (8) (2018)
Shuo Cai, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, Wei Wang
Reliability evaluation of logic circuits based on transient faults propagation metrics. IEICE Electron. Express 14 (7) (2017)
Lingyun Xiang, Xinhui Wang, Chunfang Yang, Peng Liu
A Novel Linguistic Steganography Based on Synonym Run-Length Encoding. IEICE Trans. Inf. Syst. (2) (2017)
Liao Wu, Chenrui Guo, Peng Liu, Wei Wang
A direct AC-DC converter integrated with SSHI circuit for piezoelectric energy harvesting. IEICE Electron. Express 14 (11) (2017)
Shuo Cai, Yinbo Zhou, Peng Liu, Fei Yu, Wei Wang
A novel test data compression approach based on bit reversion. IEICE Electron. Express 14 (13) (2017)
Liao Wu, Jishun Kuang, Zhiqiang You, Peng Liu, Shuo Cai
A parallel-SSHI rectifier for ultra-low-voltage piezoelectric vibration energy harvesting. IEICE Electron. Express 13 (17) (2016)
Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Weizheng Wang
Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm. IEICE Electron. Express 12 (23) (2015)
Weizheng Wang, Peng Liu, Shuo Cai, Lingyun Xiang
Low power logic BIST with high test effectiveness. IEICE Electron. Express 10 (23) (2013)
Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin
A scan disabling-based BAST scheme for test cost and test power reduction. IEICE Electron. Express 9 (2) (2012)
Weizheng Wang, Jishun Kuang, Peng Liu, Xin Peng, Zhiqiang You
Switching activity reduction for scan-based BIST using weighted scan input data. IEICE Electron. Express 9 (10) (2012)
Zhiqiang You, Weizheng Wang, Zhiping Dou, Peng Liu, Jishun Kuang
A scan disabling-based BAST scheme for test cost reduction. IEICE Electron. Express 8 (16) (2011)