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Binyong He
ORCID
Publication Activity (10 Years)
Years Active: 2019-2022
Publications (10 Years): 6
Top Topics
Estimation Algorithm
Logic Circuits
Pseudorandom Number
Secure Communication
Top Venues
J. Electron. Test.
Complex.
IEEE Access
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Publications
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Shuo Cai
,
Binyong He
,
Sicheng Wu
,
Jin Wang
,
Weizheng Wang
,
Fei Yu
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation.
J. Electron. Test.
38 (2) (2022)
Shuo Cai
,
Binyong He
,
Weizheng Wang
,
Peng Liu
,
Fei Yu
,
Lairong Yin
,
Bo Li
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults.
J. Electron. Test.
36 (4) (2020)
Fei Yu
,
Hui Shen
,
Li Liu
,
ZiNan Zhang
,
Yuanyuan Huang
,
Binyong He
,
Shuo Cai
,
Yun Song
,
Bo Yin
,
Sichun Du
,
Quan Xu
CCII and FPGA Realization: A Multistable Modified Fourth-Order Autonomous Chua's Chaotic System with Coexisting Multiple Attractors.
Complex.
2020 (2020)
Fei Yu
,
Li Liu
,
Binyong He
,
Yuanyuan Huang
,
Changqiong Shi
,
Shuo Cai
,
Yun Song
,
Sichun Du
,
Qiuzhen Wan
Analysis and FPGA Realization of a Novel 5D Hyperchaotic Four-Wing Memristive System, Active Control Synchronization, and Secure Communication Application.
Complex.
2019 (2019)
Fei Yu
,
Lixiang Li
,
Binyong He
,
Li Liu
,
Shuai Qian
,
Yuanyuan Huang
,
Shuo Cai
,
Yun Song
,
Qiang Tang
,
Qiuzhen Wan
,
Jie Jin
Design and FPGA Implementation of a Pseudorandom Number Generator Based on a Four-Wing Memristive Hyperchaotic System and Bernoulli Map.
IEEE Access
7 (2019)
Shuo Cai
,
Weizheng Wang
,
Fei Yu
,
Binyong He
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits.
J. Electron. Test.
35 (2) (2019)