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Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults.
Shuo Cai
Binyong He
Weizheng Wang
Peng Liu
Fei Yu
Lairong Yin
Bo Li
Published in:
J. Electron. Test. (2020)
Keyphrases
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logic circuits
error detection
fault diagnosis
low power
distributed systems
steady state
model based diagnosis
fault detection