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Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults.

Shuo CaiBinyong HeWeizheng WangPeng LiuFei YuLairong YinBo Li
Published in: J. Electron. Test. (2020)
Keyphrases
  • logic circuits
  • error detection
  • fault diagnosis
  • low power
  • distributed systems
  • steady state
  • model based diagnosis
  • fault detection