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Fault Modeling and Efficient Testing of Memristor-Based Memory.

Peng LiuZhiqiang YouJigang WuBosheng LiuYinhe HanKrishnendu Chakrabarty
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2021)
Keyphrases
  • limited memory
  • fault diagnosis
  • fault detection
  • decision making
  • computationally efficient
  • data streams
  • memory size