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Fault Modeling and Efficient Testing of Memristor-Based Memory.
Peng Liu
Zhiqiang You
Jigang Wu
Bosheng Liu
Yinhe Han
Krishnendu Chakrabarty
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2021)
Keyphrases
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limited memory
fault diagnosis
fault detection
decision making
computationally efficient
data streams
memory size