Low power logic BIST with high test effectiveness.
Weizheng WangPeng LiuShuo CaiLingyun XiangPublished in: IEICE Electron. Express (2013)
Keyphrases
- low power
- built in self test
- power consumption
- high speed
- logic circuits
- low cost
- low power consumption
- delay insensitive
- high power
- digital signal processing
- single chip
- wireless transmission
- vlsi architecture
- vlsi circuits
- real time
- integrated circuit
- gate array
- cmos technology
- image sensor
- power reduction
- power dissipation
- general purpose
- motion estimation
- video sequences