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Reliability evaluation of logic circuits based on transient faults propagation metrics.

Shuo CaiFei YuWeizheng WangTieqiao LiuPeng LiuWei Wang
Published in: IEICE Electron. Express (2017)
Keyphrases
  • logic circuits
  • evaluation methods
  • evaluation metrics
  • low power
  • low cost
  • fault diagnosis
  • steady state
  • evaluation measures
  • error detection
  • real time
  • neural network
  • image restoration