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Reliability evaluation of logic circuits based on transient faults propagation metrics.
Shuo Cai
Fei Yu
Weizheng Wang
Tieqiao Liu
Peng Liu
Wei Wang
Published in:
IEICE Electron. Express (2017)
Keyphrases
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logic circuits
evaluation methods
evaluation metrics
low power
low cost
fault diagnosis
steady state
evaluation measures
error detection
real time
neural network
image restoration