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Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power.

Zhiqiang YouJiedi HuangMichiko InoueJishun KuangHideo Fujiwara
Published in: Asian Test Symposium (2010)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • training set
  • data mining
  • machine learning
  • training samples
  • text categorization
  • test generation