Wilfried Daehn

Publication Activity (10 Years)

Years Active: 1981-2001
Publications (10 Years): 0

Publications

Wilfried Daehn
Demodulation based testing of off-chip driver performance. ETW (2001)
Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer
A Central Control Engine for an Open and Hybrid Simulation Environment. DIS-RT (1998)
Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer
An Open Simulation and Modeling Environment for Embedded Real-Time Systems. International Workshop on Rapid System Prototyping (1998)
Udo Jorczyk, Wilfried Daehn, Oliver Neumann
Fault modeling of differential ECL. EURO-DAC (1995)
Wilfried Daehn
Electrosmog & electromagnetic CAD. Future Gener. Comput. Syst. 11 (4-5) (1995)
David B. Bernstein, Werner van Almsick, Wilfried Daehn
Distributed simulation for structural VHDL netlists. EURO-DAC (1994)
Wilfried Daehn
Electrosmog and Electromagnetic CAD (Invited Paper). HPCN (1994)
André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams
Iterative algorithms for computing aliasing probabilities. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10 (2) (1991)
Wilfried Daehn
Fault simulation using small fault samples. J. Electron. Test. 2 (2) (1991)
Wilfried Daehn
Load Balancing in a Hybrid ATPG Environment. IEEE Trans. Computers 40 (7) (1991)
Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn
Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD (1990)
Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan
Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC (1990)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Bounds and analysis of aliasing errors in linear feedback shift registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 (1) (1988)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Aliasing Errors in Signature Analysis Registers. IEEE Des. Test 4 (2) (1987)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. ITC (1986)
Joachim Mucha, Wilfried Daehn, Josef Gross
Self-Test in a Standard Cell Environment. IEEE Des. Test 3 (6) (1986)
Wilfried Daehn, Josef Gross
A Test Generator IC for Testing Large CMOS-RAMs. ITC (1986)
Wilfried Daehn
A unified treatment of PLA faults by Boolean differences. DAC (1986)
G. Grassl, Wilfried Daehn, U. Ludemann, Ulrich Theus
Ein 32-Bit-Rechenwerk mit eingebautem Hardware-Selbsttest. Fehlertolerierende Rechensysteme (1982)
Wilfried Daehn, Joachim Mucha
Hardware Test Pattern Generation for Built-In Testing. ITC (1981)
Wilfried Daehn, Joachim Mucha
A Hardware Approach to Self-Testing of Large Programmable Logic Arrays. IEEE Trans. Computers 30 (11) (1981)