Tom W. Williams

Publication Activity (10 Years)

Years Active: 1982-1991
Publications (10 Years): 0

Publications

André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams
Iterative algorithms for computing aliasing probabilities. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10 (2) (1991)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Bounds and analysis of aliasing errors in linear feedback shift registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 (1) (1988)
Larry Carter, Leendert M. Huisman, Tom W. Williams
TRIM: testability range by ignoring the memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 (1) (1988)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Aliasing Errors in Signature Analysis Registers. IEEE Des. Test 4 (2) (1987)
Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke
Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. ITC (1986)
Leendert M. Huisman, Larry Carter, Tom W. Williams
TRIM : Testability Range by Ignoring the Memory. ITC (1986)
Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Tom W. Williams
Chip partitioning aid: A design technique for partitionability and testability in VLSI. DAC (1984)
Tom W. Williams
Sufficient Testing In A Self-Testing Environment. ITC (1984)
Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC (1982)