Accelerated test pattern generation by cone-oriented circuit partitioning.

Torsten Grüning Udo Mahlstedt Wilfried Daehn Cengiz Özcan

Published in: EURO-DAC (1990)

Keyphrases

high speed
image space
genetic algorithm
computer vision
digital circuits
partitioning algorithm
databases
machine learning
expert systems
graph cuts
logic circuits
single phase