Udo Mahlstedt

Publication Activity (10 Years)

Years Active: 1990-1995
Publications (10 Years): 0

Publications

Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
Deterministic test generation for non-classical faults on the gate level. Asian Test Symposium (1995)
Udo Mahlstedt, Jürgen Alt, Matthias Heinitz
testing. VTS (1995)
Jürgen Alt, Udo Mahlstedt
Simulation of non-classical faults on the gate level-fault modeling. VTS (1993)
Udo Mahlstedt
DELTEST: Deterministic Test Generation for Gate-Delay Faults. ITC (1993)
Udo Mahlstedt, Jürgen Alt
Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. ITC (1993)
Udo Mahlstedt, Matthias Heinitz, Jürgen Alt
Test generation for IDDQ testing and leakage fault detection in CMOS circuits. EURO-DAC (1992)
Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners
DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. ICCAD (1991)
Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn
Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD (1990)
Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan
Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC (1990)