Test generation for IDDQ testing and leakage fault detection in CMOS circuits.
Udo MahlstedtMatthias HeinitzJürgen AltPublished in: EURO-DAC (1992)
Keyphrases
- test generation
- fault detection
- test cases
- delay insensitive
- analog vlsi
- high speed
- circuit design
- symbolic execution
- test sequences
- fault diagnosis
- industrial processes
- fault identification
- software testing
- static analysis
- failure detection
- tennessee eastman
- cmos technology
- quality assurance
- fault detection and diagnosis
- code coverage
- robust fault detection
- focal plane
- test data generation
- power plant
- fuel cell
- power consumption
- floating gate
- regression testing
- power dissipation
- low voltage
- training data
- test suite
- low power
- decision support system
- artificial neural networks
- relational databases
- data sets