A Test Generator IC for Testing Large CMOS-RAMs.

Wilfried Daehn Josef Gross

Published in: ITC (1986)

Keyphrases

test cases
test data
test generation
software testing
statistical tests
test suite
data generator
test sequences
regression testing
test data generation
integration testing
number of test cases
low cost
testing process
usability testing
test set
power supply
model based testing