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Demodulation based testing of off-chip driver performance.
Wilfried Daehn
Published in:
ETW (2001)
Keyphrases
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high speed
low cost
test cases
software testing
dangerous situations
high density
real time
evolvable hardware
random access memory
circuit design
chip design
road safety
analog vlsi
programmable logic
vlsi design
test data
case study
neural network