Werner Frammelsberger

Publication Activity (10 Years)

Years Active: 2003-2017
Publications (10 Years): 1

Top Topics

Mechanical Properties

Electron Microscopy

Top Venues

Microelectron. Reliab.

Publications

Tobias Berthold, Guenther Benstetter, Werner Frammelsberger, Manuel Bogner, Rosana Rodríguez, Montserrat Nafría
Protective nanometer films for reliable Cu-Cu connections. Microelectron. Reliab. (2017)
Mario Lanza, Marc Porti, Montserrat Nafría, Guenther Benstetter, Werner Frammelsberger, Heiko Ranzinger, E. Lodermeier, G. Jaschke
Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM. Microelectron. Reliab. 47 (9-11) (2007)
W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter
Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectron. Reliab. 46 (9-11) (2006)
Peter Breitschopf, Guenther Benstetter, Bernhard Knoll, Werner Frammelsberger
Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling. Microelectron. Reliab. 45 (9-11) (2005)
Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter
New trends in the application of Scanning Probe Techniques in Failure Analysis. Microelectron. Reliab. 44 (9-11) (2004)
Günther Benstetter, Peter Breitschopf, Werner Frammelsberger, Heiko Ranzinger, Peter Reislhuber, Thomas Schweinböck
AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis. Microelectron. Reliab. 44 (9-11) (2004)
Werner Frammelsberger, Guenther Benstetter, Thomas Schweinböck, Richard J. Stamp, Janice Kiely
/Si interfaces with combined conducting and topographic atomic force microscopy. Microelectron. Reliab. 43 (9-11) (2003)