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/Si interfaces with combined conducting and topographic atomic force microscopy.

Werner FrammelsbergerGuenther BenstetterThomas SchweinböckRichard J. StampJanice Kiely
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • atomic force microscopy
  • artificial intelligence
  • image segmentation
  • user interface
  • relational databases
  • feature detection
  • database interface