Login / Signup

Protective nanometer films for reliable Cu-Cu connections.

Tobias BertholdGuenther BenstetterWerner FrammelsbergerManuel BognerRosana RodríguezMontserrat Nafría
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • electron microscopy
  • x ray
  • mechanical properties
  • thin film
  • data sets
  • database
  • machine learning
  • multi agent systems