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New trends in the application of Scanning Probe Techniques in Failure Analysis.
Thomas Schweinböck
S. Schömann
D. Álvarez
Marco Buzzo
Werner Frammelsberger
Peter Breitschopf
Günther Benstetter
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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data analysis
quantitative analysis
database
databases
special case
neural network
data mining
information retrieval
artificial intelligence
image processing
high level
bayesian networks
data structure
decision support
statistical analysis