Wei-Cheng Lien

Publication Activity (10 Years)

Years Active: 2010-2022
Publications (10 Years): 3

Top Topics

Blind Image Restoration

Restoration Method

Test Generation

High Temperature

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

J. Electron. Test.

Publications

Yan-Tsung Peng, Chen-Yu Liu, He-Hao Liao, Wei-Cheng Lien, Gee-Sern Jison Hsu
Traffic Violation Detection via Depth and Gradient Angle Change. ICITE (2022)
Wen-Yi Peng, Yan-Tsung Peng, Wei-Cheng Lien, Chu-Song Chen
Unveiling of How Image Restoration Contributes to Underwater Object Detection. ICCE-TW (2021)
Wei-Cheng Lien, Kuen-Jong Lee
Output bit selection methodology for test response compaction. ITC (2016)
Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh
Output-bit selection with X-avoidance using multiple counters for test-response compaction. ETS (2014)
Cheng-Hung Wu, Kuen-Jong Lee, Wei-Cheng Lien
An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model. VTS (2014)
Shiqian Shao, Wei-Cheng Lien, Ayden Maralani, Albert P. Pisano
Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment. ESSDERC (2014)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty
Efficient LFSR Reseeding Based on Internal-Response Feedback. J. Electron. Test. 30 (6) (2014)
Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh
Output selection for test response compaction based on multiple counters. VLSI-DAT (2014)
Yi-Hua Li, Wei-Cheng Lien, Ing-Chao Lin, Kuen-Jong Lee
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (1) (2014)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty
A New LFSR Reseeding Scheme via Internal Response Feedback. Asian Test Symposium (2013)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty, Yu-Hua Wu
Counter-Based Output Selection for Test Response Compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (1) (2013)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (8) (2013)
Wei-Cheng Lien, Tong-Yu Hsieh, Kuen-Jong Lee
Routing-efficient implementation of an internal-response-based BIST architecture. VLSI-DAT (2012)
Wei-Cheng Lien, Albert P. Pisano, Dung-Sheng Tsai, Jr-Hau He, Debbie G. Senesky
Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors. ESSDERC (2012)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume. Asian Test Symposium (2012)
Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Shih-Shiun Chien, Krishnendu Chakrabarty
Accumulator-based output selection for test response compaction. ISCAS (2012)
Kuen-Jong Lee, Wei-Cheng Lien, Tong-Yu Hsieh
Test Response Compaction via Output Bit Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (10) (2011)
Wei-Cheng Lien, Kuen-Jong Lee
A Complete Logic BIST Technology with No Storage Requirement. Asian Test Symposium (2010)