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Test Response Compaction via Output Bit Selection.

Kuen-Jong LeeWei-Cheng LienTong-Yu Hsieh
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • artificial intelligence
  • test cases
  • database
  • machine learning
  • information systems
  • decision trees
  • image segmentation
  • training set
  • image quality
  • selection criteria