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A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume.

Wei-Cheng LienKuen-Jong LeeTong-Yu Hsieh
Published in: Asian Test Symposium (2012)
Keyphrases
  • test data
  • test cases
  • training data
  • learning algorithm
  • test set
  • data sets
  • similarity measure
  • distance metric
  • hardware implementation
  • unseen data