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An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters.
Wei-Cheng Lien
Kuen-Jong Lee
Tong-Yu Hsieh
Wee-Lung Ang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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test generation
low cost
single chip
high speed
test sequences
case study
test cases
software testing
static analysis
vlsi implementation
artificial intelligence
design automation
digital signal processors