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Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors.

Wei-Cheng LienAlbert P. PisanoDung-Sheng TsaiJr-Hau HeDebbie G. Senesky
Published in: ESSDERC (2012)
Keyphrases
  • high temperature
  • field effect transistors
  • chemical vapor deposition
  • silicon dioxide
  • image processing
  • data sets
  • databases
  • artificial intelligence
  • information systems
  • grain size
  • welding process