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Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors.
Wei-Cheng Lien
Albert P. Pisano
Dung-Sheng Tsai
Jr-Hau He
Debbie G. Senesky
Published in:
ESSDERC (2012)
Keyphrases
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high temperature
field effect transistors
chemical vapor deposition
silicon dioxide
image processing
data sets
databases
artificial intelligence
information systems
grain size
welding process