Simone Borri

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 2

Top Topics

Quantum Computing

Information Retrieval Systems

Top Venues

Publications

Marco Seminara, Tecla Gabbrielli, Nicola Corrias, Simone Borri, Luigi Consolino, Marco Meucci, Paolo De Natale, Francesco Cappelli, Jacopo Catani
Characterization of noise regimes in Mid-IR free-space optical communication based on quantum cascade lasers. CoRR (2022)
Simone Borri, Mario Siciliani de Cumis, Giacomo Insero, Saverio Bartalini, Pablo Cancio Pastor, Davide Mazzotti, Iacopo Galli, Giovanni Giusfredi, Gabriele Santambrogio, Anatoliy Savchenkov, Danny Eliyahu, Vladimir Ilchenko, Naota Akikusa, Andrey Matsko, Lute Maleki, Paolo De Natale
Tunable Microcavity-Stabilized Quantum Cascade Laser for Mid-IR High-Resolution Spectroscopy and Sensing. Sensors 16 (2) (2016)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electron. Test. 22 (3) (2006)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electron. Test. 21 (5) (2005)
Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electron. Test. 21 (2) (2005)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. ETS (2004)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri
March iC-: An Improved Version of March C- for ADOFs Detection. VTS (2004)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium (2004)
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium (2003)
Simone Borri, Magali Hage-Hassan, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Defect-oriented dynamic fault models for embedded-SRAMs. ETW (2003)
Emmanuel Rondey, Yann Tellier, Simone Borri
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW (2002)
Emmanuel Rondey, Yann Tellier, Simone Borri
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. MTDT (2002)