A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.

Emmanuel Rondey Yann Tellier Simone Borri

Published in: MTDT (2002)

Keyphrases

evaluation methodology
evaluation methods
test set
evaluation framework
evaluation process
test collection
evaluation measures
evaluation metrics
information extraction
information content
training set
recommender systems
average precision