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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
Simone Borri
Magali Hage-Hassan
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Published in:
J. Electron. Test. (2005)
Keyphrases
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databases
information retrieval
dynamic environments
memory requirements
real time
artificial intelligence
feature selection
image processing
website
search algorithm
data analysis
test cases
software systems
associative memory
model based diagnosis