A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.
Emmanuel RondeyYann TellierSimone BorriPublished in: IOLTW (2002)
Keyphrases
- evaluation methodology
- evaluation methods
- test set
- evaluation process
- evaluation framework
- evaluation measures
- test collection
- evaluation metrics
- user centred evaluation
- evaluation methodologies
- information content
- evaluation criteria
- evaluation method
- query suggestion
- error rate
- information retrieval systems
- search engine