Martin Pfost

Publication Activity (10 Years)

Years Active: 1996-2018
Publications (10 Years): 3

Top Topics

Thermal Imaging

Equivalent Circuit

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

Alberto Castellazzi, Asad Fayyaz, Siwei Zhu, Thorsten Oeder, Martin Pfost
Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. IRPS (2018)
Matthias Ritter, Martin Pfost
Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress. Microelectron. Reliab. (2017)
Thorsten Oeder, Alberto Castellazzi, Martin Pfost
Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Microelectron. Reliab. (2017)
Timo Zawischka, Martin Pfost, Michael Ebli, Dragos Costachescu
An experimental study of integrated DMOS transistors with increased energy capability. ESSDERC (2013)
Martin Pfost, Pietro Brenner, Thomas Huttner, Andriy Romanyuk
An experimental study on substrate coupling in bipolar/BiCMOS technologies. IEEE J. Solid State Circuits 39 (10) (2004)
Martin Pfost, Hans-Martin Rein
Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz. IEEE J. Solid State Circuits 33 (4) (1998)
Martin Pfost, Hans-Martin Rein, Thomas Holzwarth
Modeling substrate effects in the design of high-speed Si-bipolar ICs. IEEE J. Solid State Circuits 31 (10) (1996)