Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress.

Matthias Ritter Martin Pfost

Published in: Microelectron. Reliab. (2017)

Keyphrases

high density
integrated circuit
sensor networks
real time
circuit design
cmos technology
data fusion
high speed
sensor data
multi sensor
force sensing
age estimation
sensor fusion
low power
data center
low cost
neural network
single chip
infrared
focal plane
sensor technology