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Single pulse short-circuit robustness and repetitive stress aging of GaN GITs.

Alberto CastellazziAsad FayyazSiwei ZhuThorsten OederMartin Pfost
Published in: IRPS (2018)
Keyphrases
  • short circuit
  • neural network
  • artificial intelligence
  • real time
  • computer vision
  • binary images
  • input output