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Thorsten Oeder
Publication Activity (10 Years)
Years Active: 2017-2018
Publications (10 Years): 2
Top Topics
Fault Tree
Short Circuit
Electrical Properties
Failure Modes
Top Venues
IRPS
Microelectron. Reliab.
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Publications
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Alberto Castellazzi
,
Asad Fayyaz
,
Siwei Zhu
,
Thorsten Oeder
,
Martin Pfost
Single pulse short-circuit robustness and repetitive stress aging of GaN GITs.
IRPS
(2018)
Thorsten Oeder
,
Alberto Castellazzi
,
Martin Pfost
Electrical and thermal failure modes of 600 V p-gate GaN HEMTs.
Microelectron. Reliab.
(2017)