Electrical and thermal failure modes of 600 V p-gate GaN HEMTs.
Thorsten OederAlberto CastellazziMartin PfostPublished in: Microelectron. Reliab. (2017)
Keyphrases
- failure modes
- electrical properties
- leakage current
- electrical power
- short circuit
- transmission line
- power system
- fault tree
- infrared
- low voltage
- power plant
- equivalent circuit
- power grid
- structuring elements
- visible spectrum
- cmos technology
- power supply
- physical characteristics
- field effect transistors
- gray scale
- power transmission
- thermal imaging
- high temperature
- computer engineering
- distribution networks
- multiple input