Mango C.-T. Chao

Publication Activity (10 Years)

Years Active: 2016-2023
Publications (10 Years): 18

Top Topics

Power Distribution

Optimal Placement

Rule Generation

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao
Test Generation for Defect-Based Faults of Scan Flip-Flops. VTS (2023)
Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao
Rule Generation for Classifying SLT Failed Parts. VTS (2022)
Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao
Improving Cell-Aware Test for Intra-Cell Short Defects. DATE (2022)
Po-Yan Chen, Bing-Ting Ke, Tai-Cheng Lee, I-Ching Tsai, Tai-Wei Kung, Li-Yi Lin, En-Cheng Liu, Yun-Chih Chang, Yih-Lang Li, Mango C.-T. Chao
A Reinforcement Learning Agent for Obstacle-Avoiding Rectilinear Steiner Tree Construction. ISPD (2022)
Li-Wei Chen, Yao-Nien Sui, Tai-Cheng Lee, Yih-Lang Li, Mango C.-T. Chao, I-Ching Tsai, Tai-Wei Kung, En-Cheng Liu, Yun-Chih Chang
Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs. ISQED (2022)
Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
Test Methodology for Defect-Based Bridge Faults. IEEE Trans. Very Large Scale Integr. Syst. 30 (7) (2022)
Yu-Pang Hu, Shuo-Wen Chang, Kai-Chiang Wu, Chi Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
Test Methodology for Defect-based Bridge Faults. ITC-Asia (2020)
Wen-Hsiang Chang, Li-Yi Lin, Yu-Guang Chen, Mango C.-T. Chao
Power Distribution Network Generation for Optimizing IR-Drop Aware Timing. ICCAD (2020)
Tse-Wei Wu, Dong-Zhen Lee, Yu-Hao Huang, Mango C.-T. Chao, Kai-Chiang Wu, Shu-Yi Kao, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee
Layout-Based Dual-Cell-Aware Tests. VTS (2019)
Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
Measurement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (10) (2018)
Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, Mango C.-T. Chao
DVFS Binning Using Machine-Learning Techniques. ITC-Asia (2018)
Tzu-Hsuan Huang, Wei-Tse Hung, Hao-Yu Yang, Wen-Hsiang Chang, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques. ASP-DAC (2017)
Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao
Methodology of generating dual-cell-aware tests. VTS (2017)
Wen-Hsiang Chang, Chien-Hsueh Lin, Szu-Pang Mu, Li-De Chen, Cheng-Hong Tsai, Yen-Chih Chiu, Mango C.-T. Chao
Generating Routing-Driven Power Distribution Networks With Machine-Learning Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36 (8) (2017)
Szu-Pang Mu, Mango C.-T. Chao, Shi-Hao Chen, Yi-Ming Wang
Statistical Framework and Built-In Self-Speed-Binning System for Speed Binning Using On-Chip Ring Oscillators. IEEE Trans. Very Large Scale Integr. Syst. 24 (5) (2016)
Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao
Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. IEEE Trans. Very Large Scale Integr. Syst. 24 (2) (2016)
Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique. VTS (2016)
Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax. ICCAD (2016)