Test Generation for Defect-Based Faults of Scan Flip-Flops.

Yu-Teng Nien Chen-Hong Li Pei-Yin Wu Yung-Jheng Wang Kai-Chiang Wu Mango C.-T. Chao

Published in: VTS (2023)

Keyphrases

test generation
test cases
mutation testing
flip flops
test sequences
symbolic execution
design automation
software testing
multiple input
quality assurance
test set
test suite
static analysis
real time
power dissipation
database systems
neural network
database
object oriented
relational databases
image processing