​
Login / Signup
Yu-Teng Nien
ORCID
Publication Activity (10 Years)
Years Active: 2017-2023
Publications (10 Years): 5
Top Topics
Generation Method
Statistical Tests
Image Processing
Loss Function
Top Venues
VTS
IEEE Trans. Very Large Scale Integr. Syst.
ITC
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
</>
Publications
</>
Yu-Teng Nien
,
Chen-Hong Li
,
Pei-Yin Wu
,
Yung-Jheng Wang
,
Kai-Chiang Wu
,
Mango C.-T. Chao
Test Generation for Defect-Based Faults of Scan Flip-Flops.
VTS
(2023)
Yu-Teng Nien
,
Kai-Chiang Wu
,
Dong-Zhen Lee
,
Ying-Yen Chen
,
Po-Lin Chen
,
Mason Chern
,
Jih-Nung Lee
,
Shu-Yi Kao
,
Mango Chia-Tso Chao
Methodology of Generating Timing-Slack-Based Cell-Aware Tests.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
41 (11) (2022)
Shuo-Wen Chang
,
Yu-Teng Nien
,
Yu-Pang Hu
,
Kai-Chiang Wu
,
Chi Chun Wang
,
Fu-Sheng Huang
,
Yi-Lun Tang
,
Yung-Chen Chen
,
Ming-Chien Chen
,
Mango C.-T. Chao
Test Methodology for Defect-Based Bridge Faults.
IEEE Trans. Very Large Scale Integr. Syst.
30 (7) (2022)
Yu-Teng Nien
,
Kai-Chiang Wu
,
Dong-Zhen Lee
,
Ying-Yen Chen
,
Po-Lin Chen
,
Mason Chern
,
Jih-Nung Lee
,
Shu-Yi Kao
,
Mango Chia-Tso Chao
Methodology of Generating Timing-Slack-Based Cell-Aware Tests.
ITC
(2019)
Yu-Hao Huang
,
Ching-Ho Lu
,
Tse-Wei Wu
,
Yu-Teng Nien
,
Ying-Yen Chen
,
Max Wu
,
Jih-Nung Lee
,
Mango C.-T. Chao
Methodology of generating dual-cell-aware tests.
VTS
(2017)