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Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics.

Shu-Yung BinShih-Feng LinYa Ching ChengWen-Rong LiauAlex HouMango C.-T. Chao
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • read write
  • low power
  • high speed
  • power consumption
  • database
  • training set
  • video data
  • integrated circuit