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Predicting Vt mean and variance from parallel Id measurement with model-fitting technique.

Chih-Ying TsaiKao-Chi LeeChien-Hsueh LinSung-Chu YuWen-Rong LiauAlex Chun-Liang HouYing-Yen ChenChun-Yi KuoJih-Nung LeeMango C.-T. Chao
Published in: VTS (2016)
Keyphrases
  • model fitting
  • least squares
  • shape model
  • parameter estimation
  • robust estimator
  • active appearance models
  • decision trees
  • medical image analysis
  • optimization algorithm
  • optimization method
  • simulated annealing