Ming-Tung Chang

Publication Activity (10 Years)

Years Active: 2005-2016
Publications (10 Years): 1

Top Topics

Optimal Placement

Top Venues

Publications

Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax. ICCAD (2016)
Hao-Wen Hsu, Shih-Hua Kuo, Wen-Hsiang Chang, Shi-Hao Chen, Ming-Tung Chang, Mango Chia-Tso Chao
Testing retention flip-flops in power-gated designs. VTS (2013)
Jen-Yang Wen, Yu-Chuan Huang, Min-Hong Tsai, Kuan-Yu Liao, James Chien-Mo Li, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li
Test clock domain optimization for peak power supply noise reduction during scan. ITC (2011)
Ang-Chih Hsieh, TingTing Hwang, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li
TSV redundancy: Architecture and design issues in 3D IC. DATE (2010)
Tzuo-Fan Chien, Wen-Chi Chao, James Chien-Mo Li, Yao-Wen Chang, Kuan-Yu Liao, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng
BIST design optimization for large-scale embedded memory cores. ICCAD (2009)
Hsiu-Ting Lin, Jen-Yang Wen, James Li, Ming-Tung Chang, Min-Hsiu Tsai, Sheng-Chih Huang, Chili-Mou Tseng
Capture and Shift Toggle Reduction (CASTR) ATPG to Minimize Peak Power Supply Noise. ITC (2008)
Laung-Terng Wang, Khader S. Abdel-Hafez, Xiaoqing Wen, Boryau Sheu, Shianling Wu, Shyh-Horng Lin, Ming-Tung Chang
UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. ITC (2005)