Testing retention flip-flops in power-gated designs.

Hao-Wen Hsu Shih-Hua Kuo Wen-Hsiang Chang Shi-Hao Chen Ming-Tung Chang Mango Chia-Tso Chao

Published in: VTS (2013)

Keyphrases

flip flops
power dissipation
power consumption
multiple input
long term
low power
cmos technology
real time
image processing
image segmentation
video sequences
test cases
master slave