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UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction.

Laung-Terng WangKhader S. Abdel-HafezXiaoqing WenBoryau SheuShianling WuShyh-Horng LinMing-Tung Chang
Published in: ITC (2005)
Keyphrases
  • cost reduction
  • cost savings
  • lead time
  • learning algorithm
  • optimal solution
  • graphical models
  • markov chain
  • test cases
  • video streams