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Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax.
Szu-Pang Mu
Wen-Hsiang Chang
Mango C.-T. Chao
Yi-Ming Wang
Ming-Tung Chang
Min-Hsiu Tsai
Published in:
ICCAD (2016)
Keyphrases
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optimal placement
genetic algorithm
statistical analysis
process model
machine learning
low cost
high speed
design process
steady state