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Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax.

Szu-Pang MuWen-Hsiang ChangMango C.-T. ChaoYi-Ming WangMing-Tung ChangMin-Hsiu Tsai
Published in: ICCAD (2016)
Keyphrases
  • optimal placement
  • genetic algorithm
  • statistical analysis
  • process model
  • machine learning
  • low cost
  • high speed
  • design process
  • steady state